Semiconductor devices are almost always part of a larger, more complex piece of electronic equipment. These devices operate in concert with other circuit elements and are subject to system, subsystem and environmental influences. When equipment fails in the field or on the shop floor, technicians usually begin their evaluations with the unit’s smallest, most easily replaceable module or subsystem. The subsystem is then sent to a lab, where technicians troubleshoot the problem to an individual component, which is then removed–often with less-than-controlled thermal, mechanical and electrical stresses–and submitted to a laboratory for analysis. Although this isn’t the optimal failure analysis path, it is generally what actually happens.